MAX107
Dual, 6-Bit, 400Msps ADC with On-Chip,
Wideband Input Amplifier
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Note 1: INL and DNL is measured using a sine-histogram method.
Note 2: Input offset is the voltage required to cause a transition between codes 0 and -1.
Note 3: Numbers provided are for DC-coupled case. The user has the choice of AC-coupling, in which case, the DC input voltage
level does not matter.
Note 4: The peak-to-peak input voltage required, causing a full-scale digitized output when using a trigonometric curve-fitting algo
rithm (e.g. FFT).
Note 5: Guaranteed by design and characterization.
Note 6: Common-mode rejection ratio is defined as the ratio of the change in the offset voltage to the change in the common-mode
voltage expressed in dB.
Note 7: Measured with analog power supplies tied to the same potential.
Note 8: Effective number of bits (ENOB) is computed from a curve-fit referenced to the theoretical full-scale range.
Note 9: The clock and input frequencies are chosen so that there are 2041 cycles in an 8,192-long record.
Note 10: Signal-to-noise-ratio (SNR) is measured both with the other channel idling and converting an out-of-phase signal.
The worst case number is presented. Harmonic distortion components two through five are excluded from the noise.
Note 11: Harmonic distortion components two through five are included in the total harmonic distortion specification.
Note 12: Both I and Q inputs are effectively tied together (e.g. driven by power splitter). Signal amplitude is -0.5dB FS at an input
frequency of f
IN
= 124.999 MHz.
Note 13: Measured with a differential probe, 1pF capacitance.
ELECTRICAL CHARACTERISTICS (continued)
(AV
CC
= AV
CC
I = AV
CC
Q = AV
CC
R = +5V, OV
CC
I = OV
CC
Q = +3.3V, AGND = AGNDI = AGNDQ = AGNDR = 0, OGNDI = OGNDQ
= 0, f
CLK
= 401.408MHz, C
L
= 1µF to AGND at REF, R
L
= 100Ω ±1% applied to digital LVDS outputs, T
A
= T
MIN
to T
MAX
, unless
otherwise noted. Typical values are at T
A
= +25°C)
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