MAX13042E–MAX13045E
1.62V to 3.6V Improved High-Speed LLT
2 _______________________________________________________________________________________
ABSOLUTE MAXIMUM RATINGS
Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only, and functional
operation of the device at these or any other conditions beyond those indicated in the operational sections of the specifications is not implied. Exposure to
absolute maximum rating conditions for extended periods may affect device reliability.
(All voltages referenced to GND.)
V
CC
, V
L
.....................................................................-0.3V to +4V
I/O V
CC_
..................................................... -0.3V to (V
CC
+ 0.3V)
I/O V
L_
...........................................................-0.3V to (V
L
+ 0.3V)
EN.............................................................................-0.3V to +4V
Short-Circuit Duration I/O V
L_
, I/O V
CC_
to GND .......Continuous
Continuous Power Dissipation (T
A
= +70°C)
12-Bump UCSP (derate 6.5mW/°C above +70°C) ......519mW
14-Pin TDFN (derate 24.4mW/°C above +70°C) .......1951mW
Operating Temperature Range ...........................-40°C to +85°C
Storage Temperature Range .............................-65°C to +150°C
Junction Temperature......................................................+150°C
Lead Temperature (soldering, 10s) .................................+300°C
ELECTRICAL CHARACTERISTICS
(V
CC
= +2.2V to +3.6V, V
L
= +1.62V to +3.2V, EN = V
L
, T
A
= -40°C to +85°C, unless otherwise noted. Typical values are at V
CC
=
+3.3V, V
L
= +1.8V, and T
A
= +25°C.) (Notes 1, 2)
T
A
= +25°C, EN = GND 0.1 1 µA
T
A
= +25°C, EN = GND 0.1 1
V
L
Shutdown-Mode Supply
Current
I
SHDN-VL
T
A
= +25°C, EN = V
L
, V
CC
= GND 0.1 4
µA
I/O V
CC_
, I/O V
L_
Tri-State
Leakage Current
I
LEAK
T
A
= +25°C, EN = GND 0.1 2 µA
EN Input Leakage Current I
LEAK_EN
T
A
= +25°C1µA
V
L
- V
CC
Shutdown Threshold
High
V
TH_H
V
CC
rising (Note 3) 0
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