Rainbow-electronics DAB-IMU-C01 Manual do Utilizador descarregar pdf (Página 4)

ADIS16250/ADIS16255

Rev. B | Page 4 of 20

Parameter Conditions Min Typ Max Unit

DAC OUTPUT 5 kΩ/100 pF to GND

Resolution 12 Bits

Relative Accuracy For Code 101 to Code 4095 4 LSB

Differential Nonlinearity 1 LSB

Offset Error ±5 mV

Gain Error ±0.5 %

Output Range 0 to 2.5 V

Output Impedance 2 Ω

Output Settling Time 10 µs

LOGIC INPUTS

Input High Voltage, V

INH

2.0 V

Input Low Voltage, V

INL

0.8 V

For

CS signal when used to wake up from

sleep mode

0.55 V

Logic 1 Input Current, I

INH

= 3.3 V ±0.2 ±10 µA

Logic 0 Input Current, I

INL

= 0 V

All except RST

−40 −60 A

RST

−1 mA

Input Capacitance, C

10 pF

DIGITAL OUTPUTS

Output High Voltage, V

SOURCE

= 1.6 mA 2.4 V

Output Low Voltage, V

SINK

= 1.6 mA 0.4 V

SLEEP TIMER

Timeout Period

0.5 128 sec

START-UP TIME

Initial 160 ms

Sleep Mode Recovery 2.5 ms

FLASH MEMORY

Endurance

20,000 Cycles

Data Retention

= 55°C 20 Years

CONVERSION RATE

Minimum Conversion Time 3.906 ms

Maximum Conversion Time 7.75 sec

Maximum Throughput Rate 256 SPS

Minimum Throughput Rate 0.129 SPS

POWER SUPPLY

Operating Voltage Range, V

4.75 5.0 5.25 V

Power Supply Current Normal mode at 25°C 18 mA

Fast mode at 25°C 44 mA

Sleep mode at 25°C 425 A

ADIS16255 characterization data represents ±4σ to fall within the ±1% limit.

The sensor is capable of ±600°/sec, but the specifications herein are for ±320°/sec only.

The

RST

pin has an internal pull-up.

Guaranteed by design.

Endurance is qualified as per JEDEC Standard 22 Method A117 and measured at −40°C, +25°C, +85°C, and +125°C.

Retention lifetime equivalent at junction temperature (T

) 55°C, as per JEDEC Standard 22 Method A117. Retention lifetime decreases with junction temperature.

1 2 3 4 5 6 7 8 9 ... 19 20

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